The future of semiconductor test may depend as much on data movement and workflow intelligence as on the tester hardware ...

Contributed by John P. Perdew, November 8, 2019 (sent for review June 26, 2019; reviewed by E. W. Plummer and Xinguo Ren) What is the underlying microscopic mechanism that drives the material into the ...

Anyone involved in IC product sign-off that includes a mixed signal design portion knows that developing robust tests for these intricate designs has historically been a significant bottleneck, no ...

Abstract: Scan design is a de facto design-for-testability (DfT) technique that enhances access during manufacturing test process. However, it can also be used as a back door to leak secret ...

The 62 nd DAC showcased numerous new exhibitors in 2025, including tool and IP providers, design services firms, and component marketplaces. New EDA startups, in particular, had a robust showing, with ...

Solidification processes in molten salts are technologically important in contexts including mineral processing and separation applications. However, high temperature and reactivity make studies of ...

There's a growing demand for next-generation ICs to deliver the extreme performance required for fast-evolving applications, such as AI and self-driving cars, putting tremendous pressure on the size ...

Addressing the complexity of modern ICs and their multiple cores is a challenge to the testing community. Mentor's Tessent Streaming Scan Network can ease this problem. We talk to the company's Geir ...