Two-dimensional (2D) perovskites are increasingly recognized as promising candidate materials for the next generation of optoelectronic devices. These materials combine key characteristics of both 2D ...

Nearly 660 kilometers (410 miles) beneath Earth's surface lies one of the planet's most important internal boundaries. Known ...

Researchers observed single photon emission in two dimensional layered material, zinc phosphorus trisulfide, paving the way for quantum applications.

Advanced semiconductor devices depend on intricate 3D architectures made up of diverse material layers, each critical to overall chip performance. The most popular methods for characterizing these ...

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

This image shows the silicon, silicon dioxide, and hafnium oxide layers inside a transistor channel. Credit: Cornell University A stunning new imaging breakthrough lets scientists see — and fix — the ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Scientists working at microscopic scales have relied on a single dominant fabrication technique to build complex 3D structures. Two-photon polymerization made it possible to sculpt objects far thinner ...

Increased storage needs at the edge and in the cloud are fueling rising demand for higher-capacity flash memory across multiple applications. Released every 12 to 18 months, 3D NAND scaling outpaces ...

Abstract: Through-silicon via (TSV) as a crucial interconnection microstructure in three-dimensional (3D) chip, have significantly enhanced device performance and reliability. However, the increasing ...

Matt Tucker received his PhD from the University of Kent in Canterbury, UK. He joined Oak Ridge National Laboratory in 2016 and is currently the Diffraction Section Head in the Neutron Scattering ...